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著作分類 IIRワーキングペーパー
著者 Yamauchi, Isamu : Sadao Nagaoka
論文タイトル An Economic Analysis of Deferred Examination System: Evidence from Policy Reforms in Japan
機関名 一橋大学イノベーション研究センター
ナンバー WP#14-05
公開日 2014/06/26
要旨 We investigate how a deferred patent examination system promotes ex-ante screening of patent applications, which reduces both the number of granted patents and the use of economic resources for examinations, without reducing the return from R&D. Based on a real option theory, we develop a model of examination request behaviors. Exploiting the responses of Japanese firms to recent policy reform, we find that the shortening of the allowable period for an examination request significantly increases both eventual and early requests, controlling for the blocking use of a pending patent application. This effect is stronger in technology areas with higher uncertainty. These results support the importance of uncertainty for an applicant and of ex-ante screening.
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参考URL
ラベル 知的財産制度
登録日 2014/06/26

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